Erreur de la RAM par memtest

Test 1 [Address test, own address, Sequential]  

    Each address is written with its own address and then is checked for consistency. In theory previous tests should have caught any memory addressing problems. This test should catch any addressing errors that somehow were not previously detected. This test is done sequentially with each available CPU.  

Test 2 [Address test, own address, Parallel]  

    Same as test 1 but the testing is done in parallel using all CPUs and using overlapping addresses.  

Test 3 [Moving inversions, ones&zeros, Sequential]  

    This test uses the moving inversions algorithm with patterns of all ones and zeros. Cache is enabled even though it interferes to some degree with the test algorithm. With cache enabled this test does not take long and should quickly find all "hard" errors and some more subtle errors. This test is only a quick check. This test is done sequentially with each available CPU.  

Test 4 [Moving inversions, ones&zeros, Parallel]  

    Same as test 3 but the testing is done in parallel using all CPUs.  

Test 5 [Moving inversions, 8 bit pat]  

    This is the same as test 4 but uses a 8 bit wide pattern of "walking" ones and zeros. This test will better detect subtle errors in "wide" memory chips.  

Test 6 [Moving inversions, random pattern]  

    Test 6 uses the same algorithm as test 4 but the data pattern is a random number and it's complement. This test is particularly effective in finding difficult to detect data sensitive errors. The random number sequence is different with each pass so multiple passes increase effectiveness.   

Test 7 [Block move, 64 moves]  

    This test stresses memory by using block move (movsl) instructions and is based on Robert Redelmeier's burnBX test. Memory is initialized with shifting patterns that are inverted every 8 bytes. Then 4mb blocks of memory are moved around using the movsl instruction. After the moves are completed the data patterns are checked. Because the data is checked only after the memory moves are completed it is not possible to know where the error occurred. The addresses reported are only for where the bad pattern was found. Since the moves are constrained to a 8mb segment of memory the failing address will always be less than 8mb away from the reported address. Errors from this test are not used to calculate BadRAM patterns.  

Test 8 [Moving inversions, 32 bit pat]  

    This is a variation of the moving inversions algorithm that shifts the data pattern left one bit for each successive address. The starting bit position is shifted left for each pass. To use all possible data patterns 32 passes are required. This test is quite effective at detecting data sensitive errors but the execution time is long.   

Test 9 [Random number sequence]  

    This test writes a series of random numbers into memory. By resetting the seed for the random number the same sequence of number can be created for a reference. The initial pattern is checked and then complemented and checked again on the next pass. However, unlike the moving inversions test writing and checking can only be done in the forward direction.  

Test 10 [Modulo 20, ones&zeros]  

    Using the Modulo-X algorithm should uncover errors that are not detected by moving inversions due to cache and buffering interference with the the algorithm. As with test one only ones and zeros are used for data patterns.  

Test 11 [Bit fade test, 90 min, 2 patterns]  

    The bit fade test initializes all of memory with a pattern and then sleeps for 5 minutes. Then memory is examined to see if any memory bits have changed. All ones and all zero patterns are used.